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  • maxLight High Efficiency Spectrometers

maxLight High Efficiency Spectrometers

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The XUV / VUV spectrograph features an aberration-corrected flat-field wavelength coverage from 1nm to 200nm. The available gratings cover a large spectral bandwidth, e. g. 5-80nm. It does not require an entrance slit and thus maximizes light collection.

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The modular design is able to match a variety of experimental geometries and configurations. It features an integrated slit holder and filter insertion unit, as well as a motorized grating positioning.


Characteristics

  • flat-field grazing-incidence spectrograph
  • proprietary H+P design for direct source imaging and maximum light collection
  • wavelength range from 1 to 200 nm
  • SXR 1-20nm / XUV 5-80nm / VUV 40-200nm
  • other wavelength ranges on request
  • operating pressure <10^-6 mbar
  • modular, adaptable design
  • turn-key, hassle-free operation

Detection 

Spectrometers can be operated with all state-of-the-art detection systems:

  • x-ray CCD cameras for highest resolution, large dynamic range and absolute signal strength
  • large-area MCPs for broadest wavelength coverage and gated / intensified detection

Customization

 Our goal is to supply the perfect XUV spectrometer for your application. We customize every spectrometer to exactly match the desired application. 

This includes e.g.:

  • interfacing to experimental chambers
  • adaption of the source distance
  • integration of customer-supplied detectors
  • user-defined filter mounts 

Applications

  • high harmonic generation (HHG) radiation
  • high intensity laser-matter interaction
  • undulator and free-electron-laser (FEL) radiation
  • magnetically confined plasmas
  • fusion research
  • characterization of line-emission sources
  • EUV source calibration


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CONTACT US
  • L I G H T W I N D
  • SOLUTIONS
    • Semiconductor >
      • Plasma and CVD Gas Analysis >
        • L Series: Downstream Process Spectroscopy
        • S Series: Window Mount
      • Plasma and Wet Etch Process Endpoint >
        • Wet Etch Endpoint
    • Plasma Spectroscopy >
      • Plasma Spectroscopy Systems
    • Materials Analysis
    • Raman
    • Multispectral Imaging Resources
    • Solar
    • Fluorescence Imaging
    • Raman Spectroscopy and Microscopy
  • PRODUCTS
    • Flow Cells
    • Software >
      • Analyze IQ
  • SERVICES
    • Custom Engineering >
      • Laser Induced Breakdown Spectroscopy
  • RESOURCES
    • Lightwind Software Instructional Videos >
      • Configuring and Viewing Data
      • Template and Recipe Operations
      • Endpoint
  • CONTACT
    • ABOUT US