maxLight High Efficiency Spectrometers
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per item
The XUV / VUV spectrograph features an aberration-corrected flat-field wavelength coverage from 1nm to 200nm. The available gratings cover a large spectral bandwidth, e. g. 5-80nm. It does not require an entrance slit and thus maximizes light collection.
The modular design is able to match a variety of experimental geometries and configurations. It features an integrated slit holder and filter insertion unit, as well as a motorized grating positioning.
Characteristics
- flat-field grazing-incidence spectrograph
- proprietary H+P design for direct source imaging and maximum light collection
- wavelength range from 1 to 200 nm
- SXR 1-20nm / XUV 5-80nm / VUV 40-200nm
- other wavelength ranges on request
- operating pressure <10^-6 mbar
- modular, adaptable design
- turn-key, hassle-free operation
Detection
Spectrometers can be operated with all state-of-the-art detection systems:
- x-ray CCD cameras for highest resolution, large dynamic range and absolute signal strength
- large-area MCPs for broadest wavelength coverage and gated / intensified detection
Customization
Our goal is to supply the perfect XUV spectrometer for your application. We customize every spectrometer to exactly match the desired application.
This includes e.g.:
- interfacing to experimental chambers
- adaption of the source distance
- integration of customer-supplied detectors
- user-defined filter mounts
Applications
- high harmonic generation (HHG) radiation
- high intensity laser-matter interaction
- undulator and free-electron-laser (FEL) radiation
- magnetically confined plasmas
- fusion research
- characterization of line-emission sources
- EUV source calibration
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