Effective process monitoring and fault detection/classification (FDC) demands relevant, rich data. That's why there's Lightwind Corporation. We deliver the data you need to control today's critical semiconductor manufacturing processes, including atomic layer deposition, plasma deposition, etch and photoresist strip.

See how Lightwind's real-time, in-situ process monitoring and FDC systems can help improve your yields now.
 


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  Visit us at Semicon Southwest
Booth 3026 South Hall
Moscone Center
San Francisco, CA
 
   

Be sure to ask about our new non invasive
RF probe for process troubleshooting and chamber matching.
 

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