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Thin Film Measurement
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We offer thin film measurement systems, optical spectroscopy tools and data analysis software.Our solutions are available for a variety of applications, from desktop and in-situ to in-line measurement.From polymer thickness to optical coatings thickness, practically any translucent material in 1nm - 1mm thickness range can be measured quickly and reliably :
- oxides, nitrides, semiconductors, photoresists
- thin-film solar cells
- adhesives
- LCD and touch screens
- thin metals
- hard coatings
- biomedical coatings
- polymer layers
- polymer web
- Main unit (includes spectrometer(s), light source, electronics)
- Reflectance probe
- Sample table with reflectance probe holder
- TFCompanion -R software Advanced version (USB dongle (license key), Software, user guide and other materials on USB memory stick )
- Calibration set: reference wafer (Si or Al depending on the model, or/and Quartz plate (optional)) and black absorber/pad
- Test sample- 200nm oxide wafer
- USB cable (connecting main unit to computer)
- Universal power adapter (110V/220V)