Thin Film Measurement

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We offer thin film measurement systems, optical spectroscopy tools and data analysis software.Our solutions are available for a variety of applications, from desktop and in-situ to in-line measurement.From polymer thickness to optical coatings thickness, practically any translucent material in 1nm - 1mm thickness range can be measured quickly and reliably :
  • oxides, nitrides, semiconductors, photoresists
  • thin-film solar cells
  • adhesives
  • LCD and touch screens
  • thin metals
  • hard coatings
  • biomedical coatings
  • polymer layers
  • polymer web
What’s in the box?
  • Main unit (includes spectrometer(s), light source, electronics)
  • Reflectance probe
  • Sample table with reflectance probe holder
  • TFCompanion -R software Advanced version (USB dongle (license key), Software, user guide and other materials on USB memory stick )
  • Calibration set: reference wafer (Si or Al depending on the model, or/and Quartz plate (optional)) and black absorber/pad
  • Test sample- 200nm oxide wafer
  • USB cable (connecting main unit to computer)
  • Universal power adapter (110V/220V)