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L I B S The LIBS2500plus Laser-induced Breakdown Spectrometer Measurement Systems provide real-time qualitative measurements of elements in solids, solutions and gases. These broadband, high-resolution systems provide spectral analysis across a wide 200-980 nm range (depending on the system) at a resolution of ~0.1 nm (FWHM) Systems can be portable and are useful in a variety of applications including: Materials analysis (metals, plastics etc) Environmental monitoring (soil contamination) Forensics and biomedical (teeth, bones) Military and safety (explosives, chemical and biological warfare agents) |
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N a n o c a l c The NanoCalc Thin Film Reflectometry System allows you to analyze the thickness of optical layers from 10 nm to ~250 µm.. You can measure a single thickness with a resolution of 0.1 nm. Depending on your software choice, you can analyze single-layer or multilayer films in less than one second. Applications include: thickness and removal rates of semiconductor process films or anti-scratch coatings, hard coatings and anti-reflection coatings. Can be used stand alone or automated for in situ measurements |
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S p e c E l The SpecEl-2000-VIS Ellipsometer measures polarized light reflected from the surface of a substrate to determine the thickness and refractive index of the material as a function of wavelength. The SpecEl is controlled via a PC. To measure refractive index, absorbance and thickness with the touch of a button. The SpecEl includes an integrated light source, spectrometer and two fixed polarizers. Single film thickness from .1 nm to 5 microns can be measured |
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