Effective process monitoring and fault detection/classification (FDC) demands relevant, rich data. That's why there's Lightwind Corporation. We deliver the data you need to control today's critical semiconductor manufacturing processes, including atomic layer deposition, plasma deposition, etch and photoresist strip.

See how Lightwind's real-time, in-situ process monitoring and FDC systems can help improve your yields now.
 

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SEMICON West 2006
San Francisco, CA
July 10-14
Booth 2744
South Hall

ALD 2006
Seoul, Korea
July 23-26, 2006

AEC/APC
Wesminster, CO
September 24-29

 
   
 

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